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  • 9:35 PM, Saturday, 25 Jan 2020


Course Postgraduate
Semester Electives
Subject Code CHM868
Subject Title Advanced Characterization Techniques

Syllabus

Principles, instrumentation and applications of: Ion beam techniques- Surface mass spectrometry, LEIS, ISS; Mass spectrometry- MALDI and ESI; SAXS, Introduction synchrotron radiation and its applications in materials science; Vibrational spectroscopy of surfaces- RAIR, EELS, INS, SFG, Laser Raman and other advances in Raman; Surface plasmon resonance spectroscopy; QCM-Quartz crystal microbalance, TPD

Text Books
  1. J.C. Vickerman, I. Gilmore, Surface Analysis: The Principal Techniques, 2nd ed., John Wiley & Sons, Inc.2009.
  2. H. Bubert, H. Jenett, Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications, Wiley-VCH, 2002.
  3. S. Zhang, L. Li, A. Kumar, Materials Characterisation Techniques, CRC Press, 2008.
  4. A.R. Clarke, C.N. Eberhardt, Microscopy Techniques for Material Science, CRC Press, 2002.
  5. Y.Leng, Materials Characterisation: Introduction to Microscopic and Spectroscopic Methods, John Wiley & Sons, 2008.
References